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Gene Pu6: A New Gene in Sunflower for Resistance to Puccinia helianthi. S. M. Yang, Research plant pathologist, U.S. Department of Agriculture, Agricultural Research Service, Foreign Disease-Weed Science Research, Ft. Detrick, Frederick, MD 21701; W. M. Dowler(2), and A. Luciano(3). (2)Supervisory plant pathologist, U.S. Department of Agriculture, Agricultural Research Service, Foreign Disease-Weed Science Research, Ft. Detrick, Frederick, MD 21701; (3)Senior breeder, Argentina Criadero de Semillas, S.A., Parana, Entre Rios, Argentina. Phytopathology 79:474-477. Accepted for publication 21 November 1988. This article is in the public domain and not copyrightable. It may be freely reprinted with customary crediting of the source. The American Phytopathological Society, 1989. DOI: 10.1094/Phyto-79-474.

Studies were conducted to determine the genetic basis of resistance of sunflower (Helianthus annuus) inbred line P386 to Puccinia helianthi. This study showed that P386 carries a single dominant gene conditioning resistance to the four North American (NA) races of P. helianthi. We propose the gene symbol Pun, instead of Rn, to designate the sunflower genes for resistance to P. helianthi, and the name Pu6 for the resistance gene in P386. This gene in P386 was different from the resistance gene R1 (Pu1) in CM 90RR, conferring resistance to NA races 1 and 2, and gene R2 (Pu2) in CM 29-3, conferring resistance to NA races 1 and 3. The resistance gene in P386 was also different from gene R4 (Pu4) in the sunflower inbred line HAR3 and gene R5(Pu5) in HAR2.

Additional keywords: inheritance, rust.