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Genetics

Chromosomal Location of Genes for Stripe Rust Resistance in Spring Wheat Cultivars Compair, Fielder, Lee, and Lemhi and Interactions of Aneuploid Wheats with Races of Puccinia striiformis. X. M. Chen, Department of Plant Pathology, Washington State University, Pullman, WA 99164-6430; S. S. Jones(2), and R. F. Line(3). (2)(3)Agricultural Research Service, U.S. Department of Agriculture, Pullman, WA 99164-6430. Phytopathology 85:375-381. Accepted for publication 13 December 1994. This article is in the public domain and not copyrightable. It may be freely reprinted with customary crediting of the source. The American Phytopathological Society, 1995. DOI: 10.1094/Phyto-85-375.

The spring wheat (Triticum aestivum) cultivar Lemhi has one gene, and cultivars Lee, Compair, and Fielder have two genes each for resistance to stripe rust, caused by Puccinia striiformis. To determine the chromosomal locations of the genes, the cultivars were crossed with susceptible disomic Chinese Spring and a set of 21 Chinese Spring aneuploids. Monosomic F₁ plants were cytologically determined, grown in a greenhouse, and self pollinated to produce F₂ seed F₂ seedlings and their parents were inoculated with selected North American races of P. striiformis. The results confirmed that Yr6 in Fielder is on chromosome 7B and Yr8 in Compair is on chromosome 2D; and they show that YrLem in Lemhi is on chromosome 1B, YrLe1 in Lee is on chromosome 4D, YrLe2 in Lee is on chromosome 6D, YrCom in Compair is on chromosome 5B, and YrFie in Fielder is on chromosome 6D. None of the Lee genes that we detected with North American races is Yr7. We propose official gene designations Yr19 for YrCom, Yr20 for YrFie, Yr21 for YrLem, Yr22 for YrLe1, and Yr23 for YrLe2.