International Cooperative Screening for Resistance of Peanut to Rust and Late Leaf Spot. P. Subrahmanyam, Plant Pathologist, Groundnut Improvement Program, International Crops Research Institute for the Semi-Arid Tropics (ICRISAT), Patancheru P.O., Andhra Pradesh 502 324, India. R. O. Hammons, Supervisory Research Geneticist, U.S. Department of Agriculture, Agricultural Research Service, P.O. Box 748, Tifton, GA 31793; S. N. Nigam, Plant Breeder, D. McDonald, Principal Plant Pathologist, and R. W. Gibbons, Principal Plant Breeder, Groundnut Improvement Program, ICRISAT; and Ming-Ying Fan and Wei-Lin Yeh, Vice-President and Assistant Research Fellow, Industrial Crops Research Institute, Guangdong Academy of Agricultural Sciences, Shipai, Guangzhou, Guangdong, People’s Republic of China. Plant Dis. 67:1108-1111. Accepted for publication 16 April 1983. Copyright 1983 American Phytopathological Society. DOI: 10.1094/PD-67-1108.

Following preliminary screening at Tifton, Georgia, USA, 23 peanut (Arachis hypogaea) germ plasm lines were evaluated at Isabella, Puerto Rico, and 22 of the 23 lines at both Patancheru, Andhra Pradesh, India, and Guangzhou, Guangdong, People’s Republic of China, for resistance to Puccinia arachidis rust in field trials during 1976–1981. At Patancheru and Guangzhou, the 22 entries were also evaluated for resistance to Cercosporidium personatum late leaf spot. Nine entries (PI 215696, PI 259747, PI 315608, PI 341879, PI 350680, PI 381622, PI 393646, PI 405132, PI 407454) were resistant to rust at all three locations. Six entries (PI 215696, PI 259747, PI 341879, PI 350680, PI 381622, PI 405132) were resistant to both rust and late leaf spot in Patancheru and Guangzhou and can be useful in breeding for multiple disease resistance in peanut. Four of these six entries (PI 259747, PI 350680, PI 381622, PI 405132) were previously reported resistant to both rust and late leaf spot.

Keyword(s): groundnut.