Inheritance of Septoria Leaf Blotch (S. tritici) and Pyrenophora Tan Spot (P. tritici-repentis) Resistance in Triticum aestivum cv. Carifen 12. T. S. Lee, Former Graduate Student, Department of Plant Pathology, Oklahoma State University, Stillwater 74078. F. J. Gough, Research Plant Pathologist, U.S. Department of Agriculture, Agricultural Research Service, Plant Science and Water Conservation Laboratory, Stillwater, OK 74076.. Plant Dis. 68:848-851. Accepted for publication 29 May 1984. This article is in the public domain and not copyrightable. It may be freely reprinted with customary crediting of the source. The American Phytopathological Society, 1984. DOI: 10.1094/PD-68-848.

Wheat cultivar Carifen 12 from Chile possesses resistance to Septoria leaf blotch (S. tritici) and to Pyrenophora tan spot (P. tritici-repentis). Resistance of Carifen 12 to a mixture of two cultures of S. tritici was conditioned by a single dominant gene in the F₂ and F₃ from crosses with susceptible cultivars Triumph 64 and TAM W-101. Resistance of Carifen 12 to one culture of P. tritici-repentis was conditioned by a single recessive gene pair in the F₃ of Carifen 12 × TAM W-101. A chi-square test for independence indicated a probable association (P = 0.05–0.10) between genes for resistance to Septoria leaf blotch and Pyrenophora tan spot.

Keyword(s): Drechslera tritici-repentis, genetics, Mycosphaerella graminicola.