Septoria avenae Spot as an Additional Component of the Fungal Leaf Spot Syndrome of Spring Wheat in New York. W. C. da Luz, Graduate Student, Department of Plant Pathology, Cornell University, Ithaca, NY 14853. G. C. Bergstrom, Assistant Professor, Department of Plant Pathology, Cornell University, Ithaca, NY 14853. Plant Dis. 69:724-725. Accepted for publication 25 March 1985. Copyright 1985 The American Phytopathological Society. DOI: 10.1094/PD-69-724.

During a survey of spring wheat fields in central and western New York in 1984, moderate to severe leaf spot symptoms were generally observed. One of the causal organisms was subsequently identified as Leptosphaeria avenaria f. sp. triticea (anam. = Septoria avenae f. sp. triticea), the causal fungus of Septoria avenae spot of wheat. Isolates of the fungus were found to be pathogenic on barley (cultivars Aramir and Birka) as well as on wheat (cultivars Max and Sinton), but none were pathogenic on two oat cultivars (Larry and Orbit) that were tested. This report of L. avenaria f. sp. triticea as a prevalent pathogen on wheat in New York is also the first record of the fungus in the northeastern United States.