Partial Resistance to Northern Leaf Blight and Stewart’s Wilt in Sweet Corn Germ Plasm. A. C. Meyer, Graduate Research Assistant, Department of Horticulture, University of Illinois, Urbana 61801. J. K. Pataky, and J. A. Juvik. Associate Professor, Department of Plant Pathology; and Associate Professor, Department of Horticulture, University of Illinois, Urbana 61801. Plant Dis. 75:1094-1097. Accepted for publication 25 April 1991. Copyright 1991 The American Phytopathological Society. DOI: 10.1094/PD-75-1094.

Sources of partial resistance to northern leaf blight (NLB) and Stewart’s wilt were identified in sweet corn germ plasm. Inbreds that were classified resistant to NLB in evaluations from 1988 to 1990 included IL545a, IL611a, IL676a, IL677a, IL685d, IL731a, and IL797a. Inbreds that were classified resistant to Stewart’s wilt in both 1988 and 1989 included IL126b, IL676a, IL766a, IL772a, IL772b, IL776a, and IL797a. Inbred lines with IL677a in their pedigree tended to be more resistant to NLB and Stewart’s wilt than the populations of inbreds evaluated for these two diseases. Frequency distributions of z-scores for the populations and for inbreds with IL677a in their pedigree were different when compared by chi-square contingency tests. Thus, the resistance in IL677a appears to be inherited relatively easily.

Keyword(s): Erwinia stewartii, Exserohilum turcicum, Zea mays.