Modeling the Relationship Between Alternaria Leaf Blight and Yield Loss in Muskmelon. R. X. Latin, Department of Botany and Plant Pathology, Purdue University, West Lafayette, IN 47907. . Plant Dis. 76:1013-1017. Accepted for publication 20 May 1992. Copyright 1992 The American Phytopathological Society. DOI: 10.1094/PD-76-1013.

Empirical models were developed to describe an observed relationship between Alternaria leaf blight and yield loss in muskmelon. Data used to develop and validate the models were obtained from replicated experimental field plots at two locations from 1988 to 1991. Area under disease progress curve, critical-point, and multiple-point models were derived and evaluated. All models provided a reasonably good fit to the data. However, a single area under disease progress curve model described losses at both locations, whereas separate critical-point and multiple-point models were necessary for each location. The critical-point models have potential for use in evaluating disease management decisions.