July
2000
, Volume
84
, Number
7
Pages
749
-
752
Authors
Denis A.
Shah
,
Graduate Research Assistant
, and
Gary C.
Bergstrom
,
Professor, Department of Plant Pathology
, and
Mark E.
Sorrells
,
Professor, Department of Plant Breeding, Cornell University, Ithaca, NY 14853-4203
Affiliations
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RelatedArticle
Accepted for publication 17 March 2000.
Abstract
ABSTRACT
Seed of soft white winter wheat collected from New York regional cultivar trials in 1995 and 1996 were assayed on an agar medium selective for Stagonospora nodorum. Incidence of seed infection varied with production environment. Relative incidence of seed infection differed significantly among cultivars and was consistent across environments. The flag leaves and ears of 12 cultivars were inoculated quantitatively at flowering in a glasshouse. Cultivars did not differ significantly in disease on the flag leaves. Incidence of seed infection for all cultivars was above 60%, but was significantly lower in Delaware and Houser than in other cultivars. Results confirm that wheat cultivars differ in their relative susceptibility to seed infection by S. nodorum. Resistance in wheat to seed infection by S. nodorum may be a useful mechanism for reducing initial inoculum in areas where infected seed is considered the primary inoculum source for Stagonospora nodorum blotch.
JnArticleKeywords
Additional keywords:
glume blotch,
Leptosphaeria nodorum,
Phaeosphaeria nodorum,
Septoria nodorum,
Triticum aestivum,
varietal differences
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ArticleCopyright
© 2000 The American Phytopathological Society