May
2002
, Volume
92
, Number
5
Pages
511
-
518
Authors
Denis A.
Shah
and
Gary C.
Bergstrom
Affiliations
Department of Plant Pathology, Cornell University, Ithaca, NY 14853
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Accepted for publication 22 January 2002.
Abstract
ABSTRACT
Our goal was to develop a simple model for predicting the incidence of wheat seed infection by Stagonospora nodorum across western and central New York in any given year. The distribution of the incidence of seed infection by S. nodorum across the region was well described by the beta-binomial probability distribution (parameters p and θ). Mean monthly rainfalls in May and in June across western and central New York were used to predict p. The binary power law was used to predict θ. The model was validated with independent data collected from New York. The predicted distribution of seed infection incidence was not statistically different from the actual distribution of the incidence of seed infection.
JnArticleKeywords
Additional keywords:
gamma distribution,
generalized bootstrap,
multiple regression.
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ArticleCopyright
© 2002 The American Phytopathological Society