The Youth Programs Committee and the Office of Public Awareness and Education (OPAE) of the American Phytopathological Society (APS) are sponsoring a Workshop at the annual APS Meeting which runs from July 27-31, 2002. The meeting will be held at the Midwest Express Center in Milwaukee, Wisconsin. The Workshop is designed to provide materials for middle and high school teachers who may be interested in integrating plant pathology, microbiology and even DNA technologies into their biology curriculum. The Workshop includes several presentations and demonstrations. It will be held on Wednesday, July 31 from 8:00 to 12:00 a.m.
Presentations.
- Introduction Kisha Shelton, University of Georgia, Athens, Georgia
- Girls and SHADES: The future is so bright. K.D. Gwinn, University of Tennessee, Knoxville, Tennessee
- The APSnet Education Center: New free resources for teachers. G.L. Schumann, University of Massachusetts, Amherst, Massachusetts.
- Plants in the Classroom. D.L. Schadler, Oglethorpe University, Atlanta, Georgia.
Demonstrations planned for the workshop.
- Symptoms and Signs of Plant Disease. J. H. Brock, University of Georgia, Tifton, Georgia
- Bacteria and Koch's Postulates. R..B. Carrol and T.A. Evans, University of Delaware, Newark, Delaware.
- Using the Internet. D.M. Eastburn. University of Illinois, Urbana, Illinois.
- Nematodes. G.L. Tylka. Iowa State University, Ames, Iowa.
- DNA the Easy Way. G.L. Schumann. University of Massachusetts, Amherst, Massachusetts.
Teachers or APS members interested in attending the Workshop should contact Kisha Shelton, Department of Plant Pathology, Miller Plant Science Building, University of Georgia, Athens, Georgia, 30602-7274, telephone number +1.706.542.1426, or email at kshelton@arches.uga.edu for additional information.
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Views: The Associated Press has recently reported (AP Press, Elliot Minor, Albany, Georgia) that Stemphylium leaf blight has caused a severe epidemic on the famous Vidalia onions, and about 60% of the crop has been lost. Click image for an enlarged view and more information. |